Boston University

Optical Characterization and Nanophotonics Laboratory

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[Patents][Journal Articles][Conference Papers]

Hadi F. Ghaemi

Graduate Research Assistant
Doctor of Philosophy
Brooklyn College
Assistant Professor of Physics
City University of New York

Projects

Near-field Scanning Optical Microscopy of Laser Diodes

Patents

1.) B. B. Goldberg, and H. F. Ghaemi, "Co-axial detection and illumination with shear force dithering in a near-field scanning optical microscope," United States Patent Issued, No. 5,548,113, 20 August 1996

Journal Articles

3.) B. B. Goldberg, M. S. Ünlü, W. D. Herzog, H. F. Ghaemi, and E. Towe, "Near-field optical studies of semiconductor heterostructures and laser diodes," IEEE Journal of Selected Topics in Quantum Electronics, Vol. 1, No. 4, December 1995, pp. 1073-1081

2.) H. F. Ghaemi, C. C. Cates, and B. B. Goldberg, "Low temperature near field spectroscopy and microscopy," Ultramicroscopy, Vol. 57, No. 2, February 1995, pp. 165-168

1.) H. F. Ghaemi, B. B. Goldberg, C. C. Cates, P. D. Wang, C. M. Sotomayor Torres, M. Fritze, and A. V. Nurmikko, "Spectroscopy of individual quantum structures with low-temperature near field optical microscopy," Superlattices and Microstructures, Vol. 17, No. 1, January 1995, pp. 15-18

Conference Papers

4.) B. B. Goldberg, H. F. Ghaemi, M. S. Ünlü, and W. D. Herzog, "Characterization of Materials and Devices by Near-field Scanning Optical Microscopy," Materials Research Society Proceedings Fall 1995, Vol. 406, 27-30 November 1995, pp. 171-182

3.) M. S. Ünlü, B. B. Goldberg, W. D. Herzog, H. F. Ghaemi, and E. Towe, "Layer Composition and Mode Structure Analysis of Heterojunction Laser Diodes by Near Field Scanning Optical Microscopy," 53rd Annual Device Research Conference 1995, 19-21 June 1995, pp. 148-149

2.) W. D. Herzog, B. B. Goldberg, M. S. Ünlü, H. F. Ghaemi, D. Sun, and E. Towe, "Near Field Optical Beam Induced Current Measurements for the Investigation of Quantum Structures," Proceedings of Quantum Electronics and Lasers Symposium QELS 1995, 22-26 May 1995

1.) M. S. Ünlü, B. B. Goldberg, W. D. Herzog, C. C. Cates, H. F. Ghaemi, D. Sun, and E. Towe, "Characterization of Heterojunction Laser Diodes by Near Field Optical Scanning Microscopy: Layer Composition and Mode Structure Analysis," Proceedings of IEEE Lasers and Electro-Optics Society 1994 Annual Meeting, Vol. 2, 31-Nov. 3 October 1994, pp. 209-210

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