Boston University

Optical Characterization and Nanophotonics Laboratory








[Patents][Conference Papers]

Yunjie Tong

Graduate Research Assistant
Master of Science
232 Kelton St.
Apt. 9
Allston, MA 02134


1.) M. S. Ünlü, A. K. Swan, B. B. Goldberg, S. B. Ippolito, L. Moiseev, S. H. Lipoff, and Y. Tong, "Spectral imaging for vertical sectioning ," United States Patent Issued, No. 7,110,118, 19 September 2006

Conference Papers

2.) A. K. Swan, L. Moiseev, Y. Tong, S. H. Lipoff, W. C. Karl, B. B. Goldberg, and M. S. Ünlü, "High resolution spectral self-interference fluorescence microscopy," Proceedings of SPIE: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing IX, Vol. 4621, May 2002, pp. 77-85

1.) A. K. Swan, M. S. Ünlü, Y. Tong, B. B. Goldberg, L. Moiseev, and C. R. Cantor, "Self-Interference Fluorescent Emission Microscopy - 5nm Vertical Resolution," Post Conference Proceedings of CLEO, 6-11 May 2001, pp. 360-361

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